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Advanced scanning electron microscopy and X-Ray microanalysis

Newbury, Dale E.

Advanced scanning electron microscopy and X-Ray microanalysis - New York: Plenum Press, 1986. - 454 páginas: ilustraciones; 23 cm.

Incluye índice: páginas 449-454.

Incluye referencias bibliográficas: páginas 435-448.

1. Modeling electron beam-specimen interactions -- 2. SEM Microcharacterization of semiconductors -- 3. Electron channeling contrast in the SEM -- 4. Magnetic Contrast in the SEM -- 5. Computer-Aided imaging and interpretation -- 6. Alternative microanalytical techniques -- 7. Specimen coating -- 8. Advances in specimen preparation for biological SEM -- 9. Cryomicroscopy.

0-306-42140-2

502.825/N49