000 01244nam a2200277Ia 4500
003 OSt
005 20191104155759.0
008 180305s1986||||-usaaaafr|||||||1 ||eng|d
020 _a0-306-42140-2
040 _apeliigp
_bespañol
_cpeliigp
041 _aeng
082 0 4 _221
_a502.825/N49
100 1 _91306
_aNewbury, Dale E.
_eautor
245 1 0 _aAdvanced scanning electron microscopy and X-Ray microanalysis
260 _aNew York:
_bPlenum Press,
_c1986.
300 _a454 páginas:
_bilustraciones;
_c23 cm.
500 _aIncluye índice: páginas 449-454.
504 _aIncluye referencias bibliográficas: páginas 435-448.
505 _a1. Modeling electron beam-specimen interactions -- 2. SEM Microcharacterization of semiconductors -- 3. Electron channeling contrast in the SEM -- 4. Magnetic Contrast in the SEM -- 5. Computer-Aided imaging and interpretation -- 6. Alternative microanalytical techniques -- 7. Specimen coating -- 8. Advances in specimen preparation for biological SEM -- 9. Cryomicroscopy.
700 1 _91308
_aJoy, David C.
_eautor
700 1 _91307
_aEchlin, Patrick
_eautor
700 1 _91309
_aFiori, Charles
_eautor
700 1 _91303
_aGoldstein, Joseph I.
_eautor
910 _aphc
942 _cBK
_2ddc
999 _c4305
_d4305