| 000 | 01244nam a2200277Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20191104155759.0 | ||
| 008 | 180305s1986||||-usaaaafr|||||||1 ||eng|d | ||
| 020 | _a0-306-42140-2 | ||
| 040 |
_apeliigp _bespañol _cpeliigp |
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| 041 | _aeng | ||
| 082 | 0 | 4 |
_221 _a502.825/N49 |
| 100 | 1 |
_91306 _aNewbury, Dale E. _eautor |
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| 245 | 1 | 0 | _aAdvanced scanning electron microscopy and X-Ray microanalysis |
| 260 |
_aNew York: _bPlenum Press, _c1986. |
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| 300 |
_a454 páginas: _bilustraciones; _c23 cm. |
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| 500 | _aIncluye índice: páginas 449-454. | ||
| 504 | _aIncluye referencias bibliográficas: páginas 435-448. | ||
| 505 | _a1. Modeling electron beam-specimen interactions -- 2. SEM Microcharacterization of semiconductors -- 3. Electron channeling contrast in the SEM -- 4. Magnetic Contrast in the SEM -- 5. Computer-Aided imaging and interpretation -- 6. Alternative microanalytical techniques -- 7. Specimen coating -- 8. Advances in specimen preparation for biological SEM -- 9. Cryomicroscopy. | ||
| 700 | 1 |
_91308 _aJoy, David C. _eautor |
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| 700 | 1 |
_91307 _aEchlin, Patrick _eautor |
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| 700 | 1 |
_91309 _aFiori, Charles _eautor |
|
| 700 | 1 |
_91303 _aGoldstein, Joseph I. _eautor |
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| 910 | _aphc | ||
| 942 |
_cBK _2ddc |
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| 999 |
_c4305 _d4305 |
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