TY  - BOOK
AU  - Goldstein,Joseph I.
AU  - Newbury,Dale E.
AU  - Echlin,Patrick
AU  - Joy,David C.
AU  - Fiori,Charles
AU  - Lifshin,Eric
TI  - Scanning electron microscopy and X-Ray Microanalysis: a text for biologists, materials scientists, and geologists
SN  - 0-306-40768-X
U1  - 502.825/G59 21
PY  - 1981///
CY  - New York
PB  - Plenum Press
KW  - MICROSCOPIO ELECTRÓNICO DE BARRIDO
KW  - RAYOS X
N1  - Incluye índice: páginas 665-673; Incluye referencias bibliográficas: páginas 649-664; 1. Introduction -- 2. Electron optics -- 3. Electron-beam-specimen interactions -- 4. Image formation in the scanning electron microscope -- 5. X-Ray spectral measurement: WDS and EDS -- 6. Qualitative X-Ray Analysis -- 7. Quantitative X-Ray Microanalysis -- 8. Practical Techniques of X-Ray Analysis -- 9. Materials Specimen preparation for SEM and X-ray microanalysis -- 10. Coating techniques for SEM and Microanalysis -- 11. Preparation of biological samples for scanning electron microscopy -- 12. Preparation of biological samples for X-Ray microanalysis -- 13. Applications of the SEM and EPMA to solid samples and biological materials -- 14. Data Base
ER  -