TY  - BOOK
AU  - Newbury,Dale E.
AU  - Joy,David C.
AU  - Echlin,Patrick
AU  - Fiori,Charles
AU  - Goldstein,Joseph I.
TI  - Advanced scanning electron microscopy and X-Ray microanalysis
SN  - 0-306-42140-2
U1  - 502.825/N49 21
PY  - 1986///
CY  - New York: 
PB  - Plenum Press, 
N1  - Incluye índice: páginas 449-454; Incluye referencias bibliográficas: páginas 435-448; 1. Modeling electron beam-specimen interactions -- 2. SEM Microcharacterization of semiconductors -- 3. Electron channeling contrast in the SEM -- 4. Magnetic Contrast in the SEM -- 5. Computer-Aided imaging and interpretation -- 6. Alternative microanalytical techniques -- 7. Specimen coating -- 8. Advances in specimen preparation for biological SEM -- 9. Cryomicroscopy
ER  -